ATV Digital IC Tester
Use Algorithmic/Test Vector IC Test System for Functional Testing, Characterization, Engineering Analysis, and automated testing of:
- Memories
- ASICs
- PLDs
- FPGAs
- Logic circuits
- Microprocessors / DSPs
- Mixed Signal Devices
- ADCs/DACs
Can be used for wafer or packaged parts, in labs, remote facilities, harsh environment, test chambers, small production applications.