JD Instruments

Test Capabilities

• Algorithmic Test Vector Generation
• Import Test Vectors
• 50 Million waveforms (timing diagrams) per second
• Trig-Out and Trig-In to synchronize with external hardware
• Programmable Loads

Pin Electronics

• Independent Pin Timing
• Three Programmable Drive Levels: High Drive, Low Drive, Reserve Termininate...

                    All Applied at Test Speeds

• 7 Timing Sets per Pin, Selectable On-The-Fly
• Drive Formats: RTRN0, RTRN1, RTRNC, NRZ

                    with Edge Placement of 180 pS
                    Reverse Terminate Drive Applied During DUT Outputs

• Minimum Cycle Time 20ns (50mhz) per Complete Wavefrom
• 10% - 90% rise time of 2nS (5V signal, 6 feet of cable)
• Formatted output voltage range: 0 to 5.5 V
• Outputs Individually Tri-state-able
• Pins Switchable to External Connector for Parametric Testing

TVP Card

• Six High Speed Formatted Output Pins

                    One Programable 0 to 10V for DUT Programming

• Vdd - Programmable Power Supply: 0 to +5.5 volts, 1 Amp total current
• IDDQ Measurements: 5nA to 1A in Four Ranges, 0.1% of full scale range
• Trigger In/Trigger Out

Data Card

• 16 High Speed Formatted Output Pins
• 16 Input Pins with Dual level Comparators: Valid Low and Valid High
• Pattern Generation On-the-Fly: Increment/Decrement/ALU

Address/Output-Only Card

• 24 High Speed Formatted Output Pins
• Pattern Generation On-the-Fly: Increment/Decrement/ALU

Source Measure Unit (1 SMU On TVP Card)

SIZE: (Vaires with Number of Test Pins)

• 0.6 cu. ft. (Typical for 62 pin unit)

Weight: (Vaires with Number of Test Pins)

• 11 lbs. (Typical for 62 pin unit)