Papers Referencing the use of JD Instrument Testers

 

Bings, John P. et al, “Total Dose Results for the AD9225RH Analog-to-Digital Converter”, 2003 IEEE Radiation Effects Data Workshop, PP 38-42

 

Langley,T, Koga, R. and Morris, T., “Single-event Effects Test Results of 512MB SDRAMs”, 2003 IEEE Radiation Effects Data Workshop, PP 98-101

 

Langley, T, Murray, Paul, “SEE and TID Test Results of 1 Gb Flash Memories”, 2004 IEEE Radiation Effects Data Workshop, PP 58-61

"Development, Demonstration, and Characterization of Rad-Hard AD9225 Analog to Digital Converter (ADC)," D. Morgan, et al. HEART Conference, (2003).

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