| Use Algorithmic/Test Vector IC Test System for Functional Testing, Characterization, Engineering Analysis, and automated testing of: |
|
Can be used for wafer or packaged parts, in labs, remote facilities, harsh environment, test chambers, small production applications.
|
- Memories
- ASICs
- PLDs
- FPGAs
- Logic circuits
- Microprocessors / DSPs
- Mixed Signal Devices
- ADCs/DACs
|
|
|
PWS Analog Tester
| Parametric Work Station for characterization, automated testing, parameter extraction, part sorting, statistical process control of: |
|
|
|
- Memories
- ASICs
- PLDs
- FPGAs
- Logic circuits
- Microprocessors / DSPs
- Mixed Signal Devices
- ADCs/DACs
|
|
|
DTE
Dynamic Test Environment, software for test instrumentation control, test automation,
graphics/plot, spread sheet data log and analysis tools, built in Visual Basic environment.
Included with ATV or PWS Purchase.
Custom Services
Accessories
