Products & Services

Use Algorithmic/Test Vector IC Test System for Functional Testing, Characterization, Engineering Analysis,  and automated testing of:  

ATV

Can be used for wafer or packaged parts, in labs, remote facilities, harsh environment, test chambers, small production applications.

  • Memories
  • ASICs
  • PLDs
  • FPGAs
  • Logic circuits
  • Microprocessors / DSPs
  • Mixed Signal Devices
  • ADCs/DACs
 

PWS Analog Tester

Parametric Work Station for characterization, automated testing, parameter extraction, part sorting, statistical process control of:  

PWS

  • Memories
  • ASICs
  • PLDs
  • FPGAs
  • Logic circuits
  • Microprocessors / DSPs
  • Mixed Signal Devices
  • ADCs/DACs
 

DTE

Dynamic Test Environment, software for test instrumentation control, test automation,
graphics/plot, spread sheet data log and analysis tools, built in Visual Basic environment.
Included with ATV or PWS Purchase.

Custom Services

Accessories

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